Optimization design of TEM cell based on multi-stage curved edge transition structure and magnetic loss method

Abstract

This article describes how to raise the TEM cells' operating bandwidth and lower their VSWR. A multi-stage curved-edge transition structure for minimizing VSWR and a magnetic loss mechanism for extending the operating bandwidth are proposed by evaluating the workings and constraints of TEM cells. A hybrid simulation strategy based on the particle swarm algorithm and 3D electromagnetic simulation (EM) software is suggested in order to identify the optimal quickly. In the 3D EM simulation software, the TEM cell's 3D model is created, the VSWR and return loss were solved for. It is possible to raise the operational bandwidth from 0–2 GHz to 0–5 GHz. At 0-3 GHz, measurement and simulation results are practically equal. At 3-4.5 GHz, measurement results differ somewhat from simulation results. At 4.5-5 GHz, measurement results greatly diverge from simulation results, and the parameters no longer fulfill standard criteria.

KEYWORDS:

• 3D electromagnetic simulation
• IC-EMC
• particle swarm optimization
• permeability
• TEM cells

Disclosure statement

No potential conflict of interest was reported by the author(s).

Additional information

Funding

This work has supported in part by the Industry-University-Research Cooperation of the 8th Research Institute of China Aerospace Science and Technology Corporation under Project SAST2021-069.

Notes on contributors

Jianfei Wu

Jianfei Wu (Senior Member, IEEE) was born in Jiangsu, in 1983. He received the master’s degree in electrical engineering and the Ph.D. degree in information and communication engineering from the National University of Defense Technology (NUDT), Changsha, China, in 2008 and 2013, respectively. He is currently a Researcher with the Department of Electronic Science and Technology, NUDT. He was granted a China scholarship and stayed two years at the National Institute of Applied Sciences of Toulouse (INSA), Toulouse, France, as a Joint Education Doctor from 2010 to 2012. He was leading the IC EMC Research Team at Tianjin Institute of Advanced Technology, Tianjin, China. His current research interests include EMC testing, modeling and simulation of analog and digital circuits for automobiles, and aeronautics and astronautics.

Yang Li

Yang Li was born in Tianjin, in 1994. He received the master's degree in electrical engineering from Tianjin University of Technology in 2021. He is currently an electromagnetic compatibility engineer at Tianjin Institute of Advanced Technology. His current research interests include EMC testing, electromagnetic compatibility modeling and simulation of integrated circuits.

Yanfang Lu

Yanfang Lu was born in Gansu, in 1993. She received the master’s degree in electronic and communication engineering from Tiangong University in 2021. She is currently an electromagnetic compatibility engineer at Tianjin Institute of Advanced Technology. Her current research interests include EMC testing, electromagnetic compatibility modeling and simulation of integrated circuits.

Hongli Zhang

Hongli Zhang was born in Shanxi, in 1993. She received the bachelor’s degree from the School of Mathematics at Taiyuan University of Technology in 2021. She is currently an EMC Testing Engineer at Tianjin Keepsens Information Technology Co., Ltd. Her current research interests include EMC testing.

Fang Liu

Fang Liu was born in Tianjin, in 1995. She received the master’s degree in electronic and communication engineering from Tiangong University in 2021. She is currently a software engineer at Tianjin Institute of Advanced Technology. Her current research interests include spectrum sensing and artificial intelligence.

Yifei Zheng

Yifei Zheng was born in Chengdu, Sichuan, China, in 1993. She received the master’s degree from the School of Physics and Optoelectronics, Xiangtan University, Xiangtan, China, in 2018. She is currently pursuing the Ph.D. degree with the College of Electronic Science and Technology, National University of Defense Technology, Changsha, China. Her current research interests involve on-chip ESD protection design, chip electromagnetic compatibility, and reliability.

Ledong Chen

Ledong Chen was born in Shandong, China, in 1993. He is currently pursuing the master’s degree with the College of Electronic Science and Technology, National University of Defense Technology, Changsha, China. His current research interests involve the development and improvement of EMC measuring equipment, electromagnetic field, and electromagnetic wave calculation and simulation.

Shuli Zhao

Shuli Zhao was born in Hebei, in 1997. He received the master’s degree in Agricultural Engineering and Information Technology from Hebei Normal University of Science & Technology in 2021. He is currently pursuing his Ph.D. in Electronic Information Engineering at Tiangong University and his current research interests include EMC modeling and deep learning.

Lei Han

Lei Han was born in Hebei, in 1997. He received the master's degree in control engineering from Shenyang Aerospace University in 2022. He is currently an EMC Testing Engineer at Tianjin Keepsens Information Technology Co., Ltd. His current research interests include EMC testing and deep learning.