Electronic speckle pattern interferometry based on spatial information using only two sheets of speckle patterns

Abstract

Speckle interferometry is an important deformation measurement method for an object with a rough surface. In this paper, a novel fringe analysis method is proposed that uses a new optical system, which uses a plane wave as the reference beam of the speckle interferometer. When the optical system is employed in fringe analysis, the deformation information and the bias components of the speckle patterns are clearly separated in the frequency domain. Therefore, the deformation information can be readily extracted using a Fourier transform, which gives a pair of real and imaginary components concerning the information. The specklegram is calculated using such a pair of components, and the phase map is obtained from the specklegram. Experimental results confirmed that the resolution power of this measurement method is higher than 1/261 of the wavelength of the light source of the optical system.

Keywords:

• electronic speckle pattern interferometry
• high-resolution deformation measurement
• speckle pattern
• fringe analysis