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Abstract
Reflection and refraction at an abrupt dielectric interface at normal incidence are evaluated using an amplitude and phase (amph) formalism. The optical properties of a stack with two quarter-wavelength layers are then calculated. The characteristics of a mirror constructed with quarter-wavelength layers are discussed using the amplitude and phase representation. Floquet nonlinear theorem is invoked to describe the multi-layered system. Results are consistent with Fresnel formulae and conventional matrix methods for stratified periodic media. However, the amph formalism offers several advantages: (i) it is capable of showing the field properties as it propagates though the stack, (ii) it gives a lucid physical insight because the variables involved have a clear physical meaning, and (iii) the mathematical description is simple.