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Abstract
A sinusoidal least-squares fitting algorithm (SLSF) is applied to temporal evaluation of fringe patterns. The least-squares fitting of a sine function directly with the irradiance fluctuations due to a linear sensitivity variation of the optical set-up avoids the problems inherent to Fourier analysis. Experiments show that the proposed method has a better noise immunity than the temporal Fourier method. An application of this technique to Deflectometry is also presented.