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Original Articles

Analysis of coherent symmetrical illumination for electronic speckle pattern shearing interferometry

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Pages 797-812 | Received 01 Apr 2004, Accepted 21 Jul 2004, Published online: 15 Aug 2006
 

Abstract

In an effort to find a non-contact technique capable of providing measurements of in-plane strain, a speckle shearing interferometer was designed using symmetrical coherent illumination. This paper presents an analysis of the sensitivity to displacement and strain of this interferometer, together with an analysis of the phase-stepping of the resultant fringe patterns. New notation is introduced alongside this analysis to define the interference components in speckle shearing interferometers using multiple illumination beams. Experimental results show fringe patterns and phase stepping in support of the theoretical analysis.

Notes

Additional information

Notes on contributors

John R. Tyrer

Email: [email protected]

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