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Abstract
In this paper, a normalized band-limited Weierstrass function is presented for modelling 2D fractal rough surfaces. Some conventional statistical parameters, namely the root mean square and the correlation length of rough surfaces, are used to assess between fractal parameters and the roughness of surfaces. An analytic solution of the scattered light field from these fractal surfaces is derived based on Kirchhoff theory. Three statistical parameters, namely the average scattering coefficient, the average intensity of scattered field, and the root mean square of scattered field, are introduced to study the influence of various fractal parameters on the scattered field by theoretical analysis and numerical calculations.
