40
Views
5
CrossRef citations to date
0
Altmetric
Papers

Beam reflection from multilayers with periodic and fractal distributions

&
Pages 1579-1593 | Received 19 Oct 1998, Published online: 03 Jul 2009
 

Abstract

An impedance model is used to solve the reflection problem from a multilayer with periodic and Cantor bar fractal distributions. It is based on the calculation of the input surface impedance of such a structure. The method consists of replacing the multilayer reflection problem by a simple reflection problem on a single surface. This approach has the additional advantage that only the fields above the surface should be taken into account. Numerical calculation leads to an iterative method which can be implemented for each polarization mode. The results for the input impedance function of the system and for the reflectance are presented for different iteration states. Also to quantify the comparison between both types of structures we introduce a self-similarity function which correlates orders or states of the same type.

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.