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Original Articles

Atomic force microscopy investigation of buckling patterns of nickel thin films on polycarbonate substrates

Pages 477-482 | Published online: 14 Nov 2010
 

The evolution of buckling patterns of nickel thin films have been studied in situ by atomic force microscopy during cyclic tests composed of uniaxial compression followed by release of the external applied stress. After the first strain cycling, buckling structures evolve from straight-sided wrinkles to varicose patterns characterized by a debuckling of some parts of the film. Further cycling tests reveal that rebonding of the film on its substrate does not occur once decohesion has taken place.

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