![Sample our Engineering & Technology journals, sign in here to start your access, latest two full volumes FREE to you for 14 days]({"type":"image" , "src" : "/sda/5933/TOC-Subject-Sample-2021-Engineering-Tech.jpg"})
Abstract
Using a 300 kV transmission electron microscope, lattice images of ZnSe projected on the (110) plane have been obtained. A detailed comparison between experimental and simulated images is made. The traditional simulation obtained by the superposition of free-atom potentials does not provide a fit to the elongation of close spots corresponding to adjacent columns of zinc and selenium atoms. It is also found that the difference in spot intensities for a through-focus series is not completely reproduced from such calculations. These deviations from experiment can be remedied by taking account of screening by valence-charge electrons.