Abstract
The alpha particle emission from the 19F(p, α γ)16O- nuclear reaction at the 340 keV resonance was investigated. Alpha particles with Eα = 1.72 MeV and a width of Г = 38 keV were found. The experimental energy value is in good agreement with theoretical considerations based on the reaction kinetics. For the quantitative determination of fluorine in the surface near region of silicon semiconductor wafers, a detection limit of ≲5 · 1013 F/cm2 was confirmed due to the extremely low particle background.