Computer Procedure for Resolving Overlapped Peak in X-Ray Fluorescence Spectrometry

Abstract

Trace element analysis of geological samples by X-ray fluorescence technique presents certain difficulties due to numerous peak overlaps and interelement effects. In this work limitations in spectrum analysis due to overlap interferences are discussed and have largely been overcome in the region from potassium to copper using correction software program “OVERLAP”. Two sets of standard samples were used to testfy for the precision of the results obtained.

Keywords:

• accuracy
• chemical analysis
• computer codes
• interfering elements
• nondestructive analysis
• trace amounts
• x-ray fluorescence analysis