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Abstract
Various tests have been developed to measure the mechanical bonding or adhesion of thin coatings deposited on substrates. In the pull test, pins that have been bonded to the coating under test are pulled with increasing force normal to the coating until the coating is pulled from the substrate. For many systems, large scatter in the data is often observed due to uncontrolled defects in the interface and the brittle nature of the pull test.
In this study, the applicability of Weibull statistical analysis to the adhesion of Ag coatings to vacuum sputter-cleaned zirconia was examined. Data were obtained for smooth and rough substrates for various levels of adhesion. A good fit of the data to the Weibull distribution was observed. The Weibull modulus was found to depend on the roughness of the substrate but was insensitive to the adhesion strength. This seems to be the first reported application of Weibull statistical analysis to pull test data.
Presented at the 48th Annual Meeting in Calgary, Alberta, Canada May 17–20, 1993
Notes
Presented at the 48th Annual Meeting in Calgary, Alberta, Canada May 17–20, 1993