Electrothermal Vaporization for Sample Introduction in Plasma Source Spectrometry

Abstract

Electrothermal vaporization (ETV) as a sample introduction technique for plasma source spectrometry offers several advantages over traditional solution nebulization sample introduction methods. Because volatilization of the analyte occurs in the ETV device, the plasma is not required to desolvate the sample and, therefore, the plasma has greater energy available for atomization, ionization, and excitation. The furnace also offers the ability to separate sample matrix components from the analyte of interest, which causes a reduction in interferences in the emission or mass spectrum. Both of these advantages allow for improved detectability for most elements. ETV also allows for the analysis of solid samples with minimum sample pretreatment, which broadens the numbers of samples amenable to analysis by plasma spectrometry. In the nearly 20 years that have followed the first report of ETV as a sample introduction method for plasma sources, there has been extensive research improving the design of the vaporization device, investigating matrix effects using ETV, analyzing solid samples, and coupling the devices to alternate plasma sources (other than inductively coupled plasma [ICP]). This review discusses the current state of electrothermal sample introduction for plasma source spectrometry and possible future directions of the technique.

Key Words:

• electrothermal vaporization
• inductively coupled plasma (ICP)
• microwave induced plasma
• sample introduction.