Gamma-ray-induced modifications in microscopic glass slide used as a track detector

Abstract

The Gamma-ray-induced changes in the structural and etching properties in microscopic glass slide are studied. Color transformation of the glass slides with increasing gamma dose has been observed. The bulk etch rate has been observed to increase monotonically with gamma dose, whereas for the track etch rate, there are some anomalies. Si–O bond strength is observed to decrease with increasing gamma dose.

Keywords:

• Etching parameters
• Glass slide
• Gamma irradiation
• UV–VIS and FTIR spectra

Acknowledgements

The authors thank the BARC, Mumbai for providing the gamma irradiation facilities. One of the authors (A.K.S.) thank the Inter University Accelerator Centre, New Delhi for providing financial support in the form of fellowship. Thanks are due to Prof. M. P. Mahajan, Department of Applied Chemistry, Guru Nanak Dev University, Amritsar for providing UV–VIS and FTIR spectroscopic facilities.