Track lengths of energetic ¹³²Xe ions in CR-39 detectors

Abstract

Studies of particle tracks in solids have wide ranging applications in many diverse fields of science and technology. Most of these studies require a precise knowledge of heavy ion track lengths or ranges in various knowledge of heavy ion track lengths or ranges in various commonly used solid dielectrics. We have measured the maximum etchable track lengths of ¹³²Xe at 12 different energies ranging from 5.8 MeV/u to 17.0 MeV/u in CR-39 (Homalite). The ion beam with an initial energy of 17.0 MeV/u was degraded by aluminium foils of different thickness. The detectors were irradiated at an angle of 45° to the beam direction and were etched for a period of 2–6 hrs in 6N NaOH at 55°C to reveal the tracks. The track lengths were measured using an optical microscope and the maximum etchable track lengths were determined. The standard deviations have been evaluated and the experimental results are compared with theoretical values obtained from computer codes ‘RANGE’ and ‘TRIM’ and the program of Henke and Benton.

Key words:

• CR-39
• ¹³²Xe
• track length
• computer codes TRIM and RANGE
• the program of Henke and Benton