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Materials and Manufacturing Processes Volume 29, 2014 - Issue 6
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Book Review

Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications

First Edition, Greg Haugstad, John Wiley & Sons, Hoboken, NJ, USA, 2012, 464 pp., (hardcover), ISBN 978-0-470-63882-8

Sudhindra B. Sant Department of Metallurgical & Materials Engineering, Indian Institute of Technology, Kharagpur, 721302, IndiaCorrespondence[email protected]
Pages 765-766 | Published online: 03 Jun 2014
 
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"Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications." Materials and Manufacturing Processes, 29(6), pp. 765–766

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