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Abstract
A new field method employing a portable x-ray fluorescence (XRF) instrument with a high resolution (cooled) semiconductor detector for the analysis of lead in paint and soil has been developed. This method has many of the advantages of the laboratory methods in terms of excellent precision, accuracy, and stability, yet at the same time the instrument is portable and battery operated so that samples can be analyzed immediately on site. The results for this XRF method are compared with atomic absorption results for soil and paint samples.