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Abstract
In the application of thin ferroelectric films to IR sensors, problems may arise to affect the sensitivities of the devices. The effects to influence the pyroelectric properties can be mainly categorized into two groups. One is the intrinsic effect due to the reduction in grain size. The other is the effect caused by residual stress. In this paper the stress effect on the pyroelectric properties of PbTiO 3 thin films will be studied by using the Landau-Ginsburg-Devonshire (LGD) phenomenological theory. It is found that a compressive stress increases the figure of merit while a tensile stress increases the pyroelectric coefficient for the films with the polarization vectors normal to the surface.