Influence of Temperature on the Microstructure and Electrical Properties of BBT Thin Films

G. C. Costa Chemistry Institute, Universidade Estadual Paulista, UNESP, Araraquara, SP, CEP - 14801-970, Brazil

A. Z. Simões Chemistry Institute, Universidade Estadual Paulista, UNESP, Araraquara, SP, CEP - 14801-970, Brazil E-mail: [email protected]

A. Ries Chemistry Institute, Universidade Estadual Paulista, UNESP, Araraquara, SP, CEP - 14801-970, Brazil

C. S. Riccardi Chemistry Institute, Universidade Estadual Paulista, UNESP, Araraquara, SP, CEP - 14801-970, Brazil

B. D. Stojanovic Chemistry Institute, Universidade Estadual Paulista, UNESP, Araraquara, SP, CEP - 14801-970, Brazil; Center for Multidisciplinary Studies, University of Belgrade, Yugoslavia

M. Cilense Chemistry Institute, Universidade Estadual Paulista, UNESP, Araraquara, SP, CEP - 14801-970, Brazil

M. Zaghete Chemistry Institute, Universidade Estadual Paulista, UNESP, Araraquara, SP, CEP - 14801-970, Brazil

J. A. Varela Chemistry Institute, Universidade Estadual Paulista, UNESP, Araraquara, SP, CEP - 14801-970, Brazil

show all

Abstract

The BBT films were prepared by a spin-coating process from the polymeric precursor method (Pechini process). In order to study the influence of the temperature on the BBT microstructure and electrical properties, the films were deposited on platinum coated silicon substrates and annealed from 700@C to 800°C for 2 hours in oxygen atmosphere. The crystallinity of the films was examined by X-ray diffraction while the surface morphology was analysed by atomic force microscope. The dielectric properties and dissipation factor of BaBi 2 Ta 2 O 9 films at 1 MHz were observed. The polarization-electric field hysteresis loops revealed the ferroelectric characteristics of BaBi 2 Ta 2 O 9 thin films.

Keywords:

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Order Reprints Request Corporate Permissions

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

Request Academic Permissions

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.

Influence of Temperature on the Microstructure and Electrical Properties of BBT Thin Films

Information for

Open access

Opportunities

Help and information

Influence of Temperature on the Microstructure and Electrical Properties of BBT Thin Films

Abstract

Reprints and Corporate Permissions

Academic Permissions

Related research

To cite this article:

Download citation

Information for

Open access

Opportunities

Help and information

Keep up to date

Your download is now in progress and you may close this window

Login or register to access this feature