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Integrated Ferroelectrics
An International Journal
Volume 63, 2004 - Issue 1
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Original Articles

Ferroelectric and Piezoelectric Properties of 0.24Pb(Zn1/3Nb2/3)O3ċ0.384PbZrO3ċ0.376PbTiO3 Thin Films Crystallized by Hot Isostatic Pressing

, , , , &
Pages 105-108 | Received 01 Aug 2003, Accepted 01 Jan 2004, Published online: 11 Aug 2010
 

Abstract

Ferroelectric and piezoelectric properties of Pt/0.24Pb(Zn1/3Nb2/3)O3ċ0.384-PbZrO3ċ0.376PbTiO3 (PZNZT)/PbTiO3/Pt capacitors fabricated by crystallizing amorphous PZNZT films under high pressures of 1.0–176.5 MPa using hot isostatic pressing (HIP) are investigated. All of films HIP-treated under high pressure over 17.7 MPa hardly showed the fatigue degradation up to the switching cycles of 3× 1010. From piezomeasurements using piezoresponse scanning force microscopy, it was found that the sample HIP-treated under 1.8 MPa exhibited the highest saturated piezoelectric coefficient.

ACKNOWLEDGEMENT

This work was partly supported by the Fundamental Technology Research Promotion Project in '01 from the New Energy and Industrial Technology Development Organization (NEDO) of Japan.

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