Abstract
Ferroelectric and piezoelectric properties of Pt/0.24Pb(Zn1/3Nb2/3)O3ċ0.384-PbZrO3ċ0.376PbTiO3 (PZNZT)/PbTiO3/Pt capacitors fabricated by crystallizing amorphous PZNZT films under high pressures of 1.0–176.5 MPa using hot isostatic pressing (HIP) are investigated. All of films HIP-treated under high pressure over 17.7 MPa hardly showed the fatigue degradation up to the switching cycles of 3× 1010. From piezomeasurements using piezoresponse scanning force microscopy, it was found that the sample HIP-treated under 1.8 MPa exhibited the highest saturated piezoelectric coefficient.
ACKNOWLEDGEMENT
This work was partly supported by the Fundamental Technology Research Promotion Project in '01 from the New Energy and Industrial Technology Development Organization (NEDO) of Japan.