Publication Cover
Integrated Ferroelectrics
An International Journal
Volume 67, 2004 - Issue 1
39
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Original Articles

Charge Retention Loss and Its Mechanism of (Bi, La)4Ti3O12 Capacitors

, , , , , , , , , , & show all
Pages 85-91 | Received 01 May 2004, Accepted 01 Jul 2004, Published online: 12 Aug 2010
 

Abstract

We investigated the retention properties of BLT capacitors fabricated by a chemical solution deposition with Pt electrodes. BLT capacitors showed an opposite-state retention loss much better than that of PZT capacitor. On the other hand, BLT capacitors showed a large polarization loss of the same-state retention within 1 hour baking, while the corresponding loss of PZT was negligible. The hysteresis loops after different baking time showed a negligible imprint and a large relaxation of polarization. These behaviors were explained by a high resistance against imprint and a polarization relaxation possibly due to damaged interfacial layers developed by etching process of the BLT capacitors.

ACKNOWLEDGEMENTS

This work was financially supported by the Ministry of Science and Technology through the Creative Research Initiative program and by the System IC 2010 project.

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