Abstract
The data disturbance effect in readout operation was investigated in a 1T2C-type FeRAM cell array. Based on the analysis, a method for reducing the data disturbance effect is proposed and verified by SPICE simulation as well as experimental results. Current on/off ratio of about two orders of magnitude which is sufficient to distinguish stored binary data was maintained even under the maximum disturbance condition.
ACKNOWLEDGMENTS
This work was performed under the auspices of the R&D Projects in cooperation with Academic Institutions (Next-Generation Ferroelectric Memory) supported by New Energy and Industrial Technology Development Organization (NEDO) and managed by FED (R&D Association for Future Electron Devices).