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Abstract
A study of the effects of the 3d dopants Mn, Fe, Co, Ni, and Cu on relaxor behavior and other properties of the ferroelectric PLZT8/65/35(La8) ceramic compound by X-ray diffraction, electron microscopy and other techniques is reported. The complex dielectric permittivity ϵ* = ϵ′-iϵ′′ is measured in the 20–400°C range of temperature at frequencies within the range of 102 – 106 Hz. Essential changes caused by the admixtures in the behavior of dielectric permittivity with frequency and temperature are observed along with changes in the XRD SEM patterns are observed. The mechanisms of the phenomena are discussed.