Abstract
Double perovskite Bi2NiMnO6 (BNMO) thin films with and without SrTiO3 (STO) buffer layer have been prepared on Pt (111)/Ti/SiO2/Si(100) substrates by a chemical solution deposition method. The microscopic surface morphology, ferroelectric, and leakage current have been investigated. It is shown that the STO buffer layer can improve the remnant polarization slightly, and reduce the coercive electric field from 100 to 36 kV/cm. When the positive voltage was applied on top Au electrode of the BNMO/STO/Pt thin film capacitors, the leakage current was controlled by ohmic conduction. When the negative voltage was applied on bottom Pt electron, the leakage current of BNMO/STO thin film was limited by the traps and the density of carriers at high electric field.
Acknowledgments
This work was supported by the National Natural Science Foundation of China (Grant Nos. 10774030 and 11032010), and the Guangdong Provincial Natural Science Foundation of China (Grant Nos. 8151009001000003 and 10151009001000050).