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Integrated Ferroelectrics
An International Journal
Volume 151, 2014 - Issue 1: The 12th China International Nanoscience and Technology Symposium, Chengdu (2013)
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Original Articles

An Abnormal Photoluminescence Enhancement in (Eu, Yb) Co-doped SiO2 Thin Film

C. L. HengSchool of Physics and Key Laboratory of Cluster Science of Ministry of Education, Beijing Institute of Technology, Beijing100081, ChinaCorrespondence[email protected] [email protected]
,
J. T. LiSchool of Physics and Key Laboratory of Cluster Science of Ministry of Education, Beijing Institute of Technology, Beijing100081, China
,
Z. HanSchool of Physics and Key Laboratory of Cluster Science of Ministry of Education, Beijing Institute of Technology, Beijing100081, China
&
P. G. YinKey Laboratory of Bio-Inspired Smart Interfacial Science and Technology of Ministry of Education, School of Chemistry and Environment, Beihang University, Beijing100191, China
Pages 179-186 | Received 22 Jul 2013, Accepted 07 Feb 2014, Published online: 14 May 2014
 
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Abstract

We report on the photoluminescence (PL) properties of europium (Eu) and ytterbium (Yb) co-doped SiO2 thin film. The Eu (both Eu2+ and Eu3+) PL and the Yb3+ PL is co-related under different temperature annealing. However, upon 1100°C anneal, the Eu PL intensity is significantly stronger than other temperatures anneal. Transmission electron microscopy, X-ray photoelectron spectroscopy and X-ray diffraction results, suggest that meta-stable Eu2+-related silicates (EuSiO3) have formed in the oxide as well as the formation of Yb2Si2O7.

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