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ABSTRACT
The influences of Y and Mn alternately doped order on the microstructures and dielectric properties of the Ba0.6Sr0.4TiO3 (BST) films were reported in this paper. The Y and Mn alternately doped BST films were designed as YBST/MnBST/… and MnBST/YBST…multilayer films orderly expressed as (Y/Mn)M and (Mn/Y)M for short, and prepared on Pt/Ti/SiO2/Si wafers by an improved sol-gel method, where Y and Mn represent yttrium doped BST layer and manganese doped BST layer, and M is cycle unit, respectively. The microstructures of the alternately doped BST films were observed by SEM and the capacitance-voltage curves at 100 kHz or 1 MHz were measured by a HP4284A LCR meter and the dielectric properties in the range of 1GHz were measured by an E4991A impedance analyzer. Compared to Y or Mn doped multilayer BST film, (Y/Mn)M and (Mn/Y)M show higher dielectric tunability and lower dielectric loss with higher dielectric constant. Moreover, (Y/Mn)M show better dielectric properties than (Mn/Y)M because (Y/Mn)M show granular microstructures independent of M, while the (Mn/Y)M show granular microstructures when M is 2 and add to a surface layer of columnar microstructures on the granular microstructures when M is 4. The related mechanisms were obtained in terms of the XRD phase structures, the cross-sectional SEM microstructures and the AFM morphologies.
Funding
The paper is supported by the National Natural Science Foundation of China of 51172034, 61301052 and 61474016, the field of equipment development fund of 61409220110, the National Defense Science and technology innovation special zone project of 17-163-13-ZT-009-125-001, the International cooperation project of Sichuan Provincial Department of science and technology (2017HH0067), and the Sichuan science and technology support projects of 2017GZ0105.