Negative differential resistivity in ferroelectric thin-film current-voltage relationships

J. F. Scott Symetrix Corporation, Colorado Springs, CO, USA; University of Colorado, Depts. of Physics and of Electrical Engineering, Boulder and Colorado Springs, CO, USA

B. M. Melnick Symetrix Corporation, Colorado Springs, CO, USA; University of Colorado, Depts. of Physics and of Electrical Engineering, Boulder and Colorado Springs, CO, USA

J. D. Cuchiaro Symetrix Corporation, Colorado Springs, CO, USA; University of Colorado, Depts. of Physics and of Electrical Engineering, Boulder and Colorado Springs, CO, USA

R. Zuleeg Symetrix Corporation, Colorado Springs, CO, USA; University of Colorado, Depts. of Physics and of Electrical Engineering, Boulder and Colorado Springs, CO, USA

C. A. Araujo Symetrix Corporation, Colorado Springs, CO, USA; University of Colorado, Depts. of Physics and of Electrical Engineering, Boulder and Colorado Springs, CO, USA

L. D. McMillan Symetrix Corporation, Colorado Springs, CO, USA; University of Colorado, Depts. of Physics and of Electrical Engineering, Boulder and Colorado Springs, CO, USA

M. C. Scott Symetrix Corporation, Colorado Springs, CO, USA; University of Colorado, Depts. of Physics and of Electrical Engineering, Boulder and Colorado Springs, CO, USA

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Abstract

The current-voltage relationship I(V) for several different ferroelectric thin films often exhibits an apparent negative differential resistivity. In the present paper we show that in lead zirconate-titanate (PZT) this is a spurious artifact arising from rapid (parametric) measurement techniques and that it disappears for d.c. measurements made with measuring times ≥300 s. However, in other ferroelectric materials (selected samples with unusually high trap densities) it appears to be a genuine effect characterized by an I = aV³ current-voltage relationship at high current densities (≥100 nA/cm²), I(V) hysteresis above a “pseudo-breakdown voltage,” and distinct V ²-to-V ³ cross-over threshold.

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Negative differential resistivity in ferroelectric thin-film current-voltage relationships

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Negative differential resistivity in ferroelectric thin-film current-voltage relationships

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