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Abstract
Pt/Ti bilayers with various thicknesses of Ti adhesive layer were deposited in-situ by electron-beam evaporation on SiO2/Si substrates to investigate crystallinity, interdiffusion and surface morphology of Pt and overgrown BST films. It was found that the properties of Pt and BST films are strongly dependent on the thickness of a Ti layer, and the problems in Pt/Ti bilayer structure can be solved by using the Ti adhesive layer with the thickness range from 30 Å to 50 Å. Moreover, we could confirm the usefulness of Pt/Ti structure with suggested Ti thickness from the measurements of electrical properties such as dielectric constant and leakage current density.