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Integrated Ferroelectrics
An International Journal
Volume 19, 1998 - Issue 1-4
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Original Articles

Characterization of Ba0.6Sr0.4TiO3 thin films with Mg additive fabricated by Metalorganic decomposition technique

, , , &
Pages 141-148 | Received 20 Jun 1997, Published online: 03 Sep 2006
 

Abstract

We report for the first time Ba0.6Sr0.4TiO3 (BST 60/40) thin films with Mg additive fabricated by Metalorganic decomposition technique on platinum coated silicon substrates using acetate-alkoxide precursors.[1] The structural and electrical properties of the BST thin films were greatly changed by additions of Mg. The surface morphology of the films was smooth with a dense microstructure. The typical small signal dielectric constant and the loss factor for a 0.4 μm thick undoped BST films were 450 and 0.013, respectively, at an applied frequency of 100 kHz. The dielectric loss was significantly reduced by the Mg content. The tunability (ΔC/C0) was found to change from 20.7% to 5.8% as the Mg additive content was changed from 0 to 20 mol%. The films exhibited high resistivity of the order of 1012 Ω-cm even up to an applied electric field of 100 kV/cm.

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