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Integrated Ferroelectrics
An International Journal
Volume 22, 1998 - Issue 1-4
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Session 10. Piezoelectric and mems applications

Compositional dependence of electrical properties in plzst thin films

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Pages 501-513 | Received 04 Mar 1998, Published online: 19 Aug 2006
 

Abstract

The purpose of this work was to conduct a systematic study of lanthanum doped lead zirconate stannate titanate (PLSZT) thin films with compositions in the antiferroelectric tetragonal (AFET) and the antiferroelectric orthorhombic (AFEO) region. The effects of varying factors such as Sn content, Zr content, etc. were studied. While the compositions in the AFET region demonstrate clear double hysteresis loops, there is always some remanent polarization when the electric field is removed. The remanent polarization decreases when compositions are chosen farther away from the ferroelectric-antiferroelectric phase boundary. On the other hand in the AFEO region all the compositions show zero remanent polarization, especially those with higher Zr content which have previously seldom been studied. The results also show that these high Zr AFEO compositions have high energy storage densities making them suitable for energy storage applications such as decoupling capacitors in high speed multichip modules.

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