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Original Articles

Electrical Switching and Memory Phenomena in AI/[TBAyNi(DMID)2]/Cu System

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Pages 229-243 | Received 10 May 1995, Accepted 17 Jul 1995, Published online: 04 Oct 2006
 

Abstract

A sandwich structure of A1/[TBA] y [Ni(DMID)2]/Cu shows a bistable and reproducibe electric field- induced switching and memory phenomenon (TBA = tetrabutylammonium, DMID = 1,3-dithiole-2-one-4,5,-dithiolate). Preparation, characterization and electrical properties of this organic thin film materials are reported with those of the related materilas. The current-voltage (I-V) characteristics of A1/[TBA] y [Ni(DMID)2]/Cu reveal an abrupt decrease in resistance form a high to a low impedance state at a electric field strength of about 2400 V/cm for a 5 μm thick film sample. Switching with high-power dissipation yields a low-impedance memory state which can be erased by the application of large currents, typically 3–10 mA (0.3–1.0 A/cm2), in either direction. In addition, the high-resistance state could also be re-established by allowing the device to remain for extended periods of time without an external electric field. The character of the switching from a high to a low impedance state in this organic charge transfer complex is same to the organic charge transfer complexes of M-TCNQ type (M = Cu, Ag; TCNQ = 7,7,8,8-tetracyano- p-quinodimethane). However, this contraster to the behavior observed in A1/[TBA]0.9[Ni(DMID)2/Pt system.

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