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Abstract
A cursory investigation to ascertain the possible application of an advanced x-ray diffraction instrument for the rapid, non-destructive characterization of residual stress and preferred orientation in nickel-plate on a steel substrate is described. The instrument applied to this study is based upon the Ruud-Barrett position-sensitive x-ray detector and included selecting the most suitable characteristic x-radiation to be used for x-ray diffraction analysis. Both the single-exposure, double-exposure, and sin-square-psi techniques of x-ray stress analysis were applied and are compared. Relative x-ray intensities diffracted from planes at various orientations to the surface were examined to provide indications of the crystallographic texture in two specimens with different qualities of plating. It was concluded that residual stress measurements did not provide a clear distinction between the two specimens; but comparison of the relative intensities diffracted from crystallographic planes at certain orientations with the surface showed promise in providing a distinction.