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Original Articles

APPLICATION OF AN ADVANCED X-RAY DIFFRACTION INSTRUMENT TO NONDESTRUCTIVE MATERIALS CHARACTERIZATION

Pages 19-27 | Published online: 10 May 2007
 

Abstract

A unique x-ray diffraction detector has been developed and has been incorporated in an advanced instrument for nondestructive materials characterization. This note briefly describes the instrument and its application to characterization of three types of materials: two of these metals and one a ceramic. Characterization of preferred orientation, residual stress, and induced cold work are described.

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