Calibration of instrument and sample parameters for small angle X-ray scattering

ABSTRACT

A method for calibrating the parameters of a small angle X-ray scattering instrument using the diffraction ring of a standard sample is presented. A generalized geometric model for small angle X-ray scattering was constructed and detailed mathematical derivations presented to solve for the relevant instrument parameters, which were then used to convert two-dimensional small angle X-ray scattering data to standard curves. The method is valid regardless whether the detector photosensitive plane is perpendicular or tilted with respect to the beam. Small angle X-ray scattering was performed using standard calibration samples to validate the methodology.

KEYWORDS:

• Detector tilt
• instrument parameters
• small angle X-ray scattering
• small angle X-ray scattering calibration

Acknowledgments

The authors thank Dr. Michel Koch (EMBL) and Dr. Youli Li (University of California) for their help in revising this article.