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ABSTRACT
A continuous flow device to characterize the growth of nanometer particles was assembled. In-situ millisecond or second-order time-resolved small angle x-ray scattering and x-ray absorption spectroscopy was performed using this device at the Beijing Synchrotron Radiation Facility. The time resolution was adjusted from 10 ms to 1.0 s by changing the flow rate of the solution. The temperature was variable from 5–95°C. Custom-designed pulse eliminators were employed to eliminate adverse pump fluctuations and improve the quality of measurements. The system was used to characterize zinc sulfide nanoparticles by small angle x-ray scattering and x-ray absorption spectroscopy.