TEMPERATURE-DEPENDENT FAR-INFRARED ABSORPTANCE OF THIN YBa2Cu3O7-delta FILMS IN THE NORMAL STATE

Abstract

This work presents the absorptance of high-temperature superconducting YBa2Cu3O7-delta (YBCO) films, deposited on Si substrates, in the far infrared from 15 to 95 cm - 1 (wavelength from 667 to 105 mu m) at temperatures of 100, 200, and 300 K (i.e., in the normal state). Our experiments show a significant difference in the absorptance for radiation incident on the film side as compared to radiation incident on the substrate side. Interference fringes associated with the Si substrate are observed from the measurement and used to analyze the interaction of radiation with the film - substrate composite at the interface. The film thickness is found to have a strong effect on the absorptance of the film - substrate composite, especially for radiation incident on the substrate side.