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Original Articles

Characterization of impurities in nonionic surfactants and their effect on ultraviolet light absorbers

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Pages 1459-1475 | Accepted 16 Mar 1991, Published online: 15 Dec 2008
 

Summary

A thin layer Chromatographic method has been developed to characterize polyethylene glycol in commercial nonionic surfactants. The influence of these contaminants on the solubility and spectral properties of certain ultraviolet light absorbing compounds has been studied. The presence of impurities lowered the solubility of the absorbers and higher wavelengths of maximum absorbance (λ max.) are observed which changed gradually to lower wavelength with time. The ultraviolet light absorbers used are representative of two structural classes, the substituted benzophenone (Uvinul D‐50) and the substituted acrylonitrlles (Uvinul N‐35). It has been found that the absorber which has greater degree of interaction with the polyoxyethylene chain of the micelle is more affected by the contaminants.

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