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Philosophical Magazine B Volume 82, 2002 - Issue 4
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Original Articles

Temperature dependence of the density fluctuations of silica by small-angle X-ray scattering

R. Le Parc Laboratoire de Physico-Chimie des Matériaux Luminescents, Unité Mixte de Recherche associée au CNRS 5620, Université Claude Bernard Lyon 1, bǎtiment Lippmann, 12 rue Ampère, Domaine Scientifique de la Doua, 69622, Villeurbanne, Cedex, France
,
B. Champagnon Laboratoire de Physico-Chimie des Matériaux Luminescents, Unité Mixte de Recherche associée au CNRS 5620, Université Claude Bernard Lyon 1, bǎtiment Lippmann, 12 rue Ampère, Domaine Scientifique de la Doua, 69622, Villeurbanne, Cedex, France
,
L. David Groupe d'Étude de Métallurgie Physique et de Physique des Matériaux, Unité Mixte de Recherche associée au CNRS 5510, bǎtiment Biaise Pascal, Institut National des Sciences Appliquées, Lyon, 69622, Villeurbanne, Cedex, France
,
A. Faivre Laboratoire des Verres, bǎtiment 13, Université Montpellier II, place E. Bataillon, cc69, 34095, Montpellier, Cedex, France
,
C. Levelut Laboratoire des Verres, bǎtiment 13, Université Montpellier II, place E. Bataillon, cc69, 34095, Montpellier, Cedex, France
,
Ph. Guenot Alcatel, Recherche et Developpement Fibres Optiques, 53 rue Jean Broutin, 78700, Conflans Sainte Honorine, France
,
J. L. Hazemann European Synchrotron Radiation Facility and Laboratoire de Cristallographie, CNRS, 25 avenue des Martyrs, BP 166, 38042, Grenoble, Cedex, 9, France
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C. Rochas European Synchrotron Radiation Facility and Laboratoire de Spectrometrie Physique, Unité Mixte de Recherche associée au CNRS 5588, Université Joseph Fourier Grenoble 1, Bat. E, 140 avenue de la Physique, BP 87, 38402, Saint Martin d'Hérès, France
&
J. P. Simon European Synchrotron Radiation Facility and Laboratoire de Thermodynamique et Physicochimie Metallurgiques, CNRS, Institut National Polytechnique et Université Joseph Fourier Grenoble, BP 75, 38402, St Martin d'Hérès, France
 show all
Pages 431-438 | Published online: 04 Aug 2009
 

Abstract

Low-OH-content silica samples having fictive temperatures in the interval 1000–1500°C, have been studied by small-angle X-ray scattering using synchrotron radiations both at room temperature and from 20 to 1500deg;C. The limit for zero-angle X-ray scattering intensity is analysed in term of density fluctuations. We demonstrate that density fluctuations are strongly related to structural relaxation; both depend on thermal history (i.e. the fictive temperature) of the sample, in the temperature range below Tg.

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