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Philosophical Magazine B Volume 47, 1983 - Issue 5
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Original Articles

The recursion method and the electronic charge density in diamond and silicon

R. JonesDepartment of Physics, University of Exeter Stocker Road, ExeterEX4 4QL, England
&
T. KingDepartment of Physics, University of Exeter Stocker Road, ExeterEX4 4QL, England
Pages 491-493 | Received 13 Oct 1982, Accepted 10 Dec 1982, Published online: 30 Oct 2015
 
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Abstract

A method for calculating the electronic charge density in a small region at the centre of a cluster of atoms by means of the recursion method is presented. The results of the application of this technique to diamond and silicon are discussed.

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