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Letters Section

IVAP-originated two-level systems and tunnelling atoms in lone-pair amorphous semiconductors

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Pages 311-320 | Received 15 Jun 1983, Accepted 15 Jun 1983, Published online: 06 Dec 2006
 

Abstract

It is shown that two-centre defects, closely related to intimate valence-alteration pairs (IVAPs), display the same statistical features as those suggested in the tunnelling-atom theory for two-level, low-energy excitations. Comparisons are made with measured short- and long-time relaxation effects in vitreous silica. The possibility that two-level systems originating from IVAPs and from tunnelling can co-exist in a-SiO2 is discussed, with particular reference to very-long-time relaxation effects.

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