5
Views
22
CrossRef citations to date
0
Altmetric
Letters section

A reflection high-energy electron diffraction study of ultra-thin Langmuir-Blodgett films of ω-tricosenoic acid

, , &
Pages L89-L94 | Received 06 May 1986, Accepted 29 Jul 1986, Published online: 27 Sep 2006
 

Abstract

Although there have been several previous reflection high-energy electron diffraction (RHEED) studies of ω-tricosenoic acid Langmuir-Blodgett films, very little attention has been given to the structure of the first few monolayers deposited. In this paper we show that, for films dipped onto hydrophilic silicon and comprising fewer than seven monolayers, the molecular chains are all tilted at ∼20° to the substrate normal, but the direction of this tilt vanes from grain to grain. In thicker films, the molecules in all of the grains are tilted in the same direction which is upwards from the substrate normal for vertical dipping: however, the isotropic structure of the underlying layers is retained. The effects of the chemical nature of the substrate surface, substrate orientation and dipping configuration are also described.

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.