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Abstract
We present an experimental realization of dielectric breakdown in disordered media by means of a random network made of resistors (concentration p) and diodes (concentration 1–p). The diodes are considered as elements which become conductors for a voltage greater than a specific value. Near the percolation threshold we find that the critical exponent of the breakdown voltage is greater than that of the correlation length. Using light-emitting diodes, we can display the breakdown paths and determine their properties.