Diffraction of X-rays by hexagonally close-packed crystals containing extrinsic stacking faults

Abstract

A theoretical model is developed for an h.c.p. crystal containing extrinsic stacking faults. The probability of faults occurring between any close-packed layers of the original crystal α, and the probability that an inserted (condensed) layer is followed by another inserted (condensed) layer β, are calculated. The different diffraction effects for different values of α and β are predicted.