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Original Articles

Rapid solidification processing and characterization of semiconducting Inx, Ga1-x alloys

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Pages 513-528 | Received 06 Jan 1988, Accepted 21 Mar 1988, Published online: 20 Aug 2006
 

Abstract

Vacuum-sealed Inx, Ga1-x, (x = 0·1 1–0·93) alloys were rapidly solidified at cooling rates greater than l06 Ks−l by ejecting melts on to a rotating copper disc. Thin flake or alloy powder formation was studied at disc spinning velocities in the approximate range 14–64ms−1. X-ray diffraction, transmission electron microscopy and thermal analyses revealed non-equilibrium microcrystalline phases in the flakes and powders with average grain sizes varying from about 2·7 to 7 μAmorphous phase formation was also observed in powders of two indium concentrations (x = 0·51 and x = 0middot;44) at disc velocities of about 25 and 64ms−l. Electrical resistivity data (100–400°c) on flakes of the x = 0·51 alloy suggest a resistivity minimum at about 100°C.

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