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Original Articles

Cathodoluminescence and X-ray analysis of defect reaction in Ag—CdS polycrystalline layers

Pages 347-359 | Received 27 Jul 1988, Accepted 02 Oct 1989, Published online: 20 Aug 2006
 

Abstract

The diffusion of silver in the surface region of evaporated CdS polycrystalline films and single crystal has been carried out at 300°C for diffusion times between 5 min and 60 h. The diffusion profiles were studied by cathodoluminescence (CL) and X-ray analysis. The very sensitive CL modulation across the diffusion front correlates with EPMA; both techniques show anomalous oscillating profiles. Based on self-compensation theory and self-induced field effects, as well as on complex formation between impurities, a phenomenological model is proposed.

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