Relation between the tangent of the angle of dielectric losses and low drift mobility in dielectrics

Abstract

In the framework of a two-layer model we study dielectrics with an inhomogeneous distribution of current carriers and show that the low drift mobility of current carriers relates directly to a maximum in the tangent of the angle of dielectric losses (tan δ) on a curve which represents a dependence of tan δ on frequency. Experimental data for amorphous Ta₂O₅, films irradiated by ultraviolet light are in accordance with the theory. The drift mobility is estimated to be equal approximately to 10⁻¹⁵ cm² V ⁻¹ s⁻¹.