Abstract
From current-voltage and photocurrent-voltage characteristics, the energy band diagrams of a-Si1-xGex: H/c-Si, a-Si: H/c-Si and a-Si1-x,Cx: H/c-Si heterojunctions have been determined. A comparison between the conduction band discontinuity δEc, and the difference δEg, between amorphous and crystalline optical bandgaps leads to a ratio δEc/δEg, equal to 0.66 ± 0.02 (a-Si1-x,; H; Eg, = 1.90 eV), 066 ± 006) (a-Si:H; E, = 1·70eV), 0.79±0.04 (a-Si1-x,Gex,:H; Eg,=1.48eV). A correlation is found between δEc, and the difference Ec-Ef, between the amorphous conduction-band edge and Fermi level energies. Analysis of the current-voltage characteristics in the case of n- and p-doped crystalline substrates indicates a dominance of tunnelling mechanisms in most cases.