Abstract
The mixed dynamic form factor (MDFF) is the basic quantity in inelastic electron scattering experiments. Although it is often dominated by the usual dynamic form factor, it can in principle be measured in interferometry-like inelastic electron scattering experiments which have gained increasing popularity. We therefore derive an expression for the MDFF for atomic core-level excitations and discuss it in detail. Simulations for silicon, using Hartree-Slater-like atomic wave functions, illustrate the results. Beyond the theoretical interest, two practical applications to the measurement of the MDFF are envisaged