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Abstract
The WAIS-R Digit Symbol subtest and the Symbol Digit Modalities Test (SDMT) scores are compared on 157 former micro-electronics workers with organic solvent exposure and 113 nonexposed comparison subjects. The majority of both groups were Hispanic females (88% and 91%) with similar educational levels (M 11.6 and 12.1 years) and age (M 44.7 and 43.8 years). Both the SDMT and the Digit Symbol test differentiated the solvent exposed former micro-electronics workers from the nonexposed comparison subjects, with the exposed scoring lower than the comparison subjects on both the Digit Symbol test (M 47.4 vs. 54.4) and the SDMT (M 39.1 vs. 43.1). Scores between the SDMT and the Digit Symbol test correlated highly for the former workers (r = .78) and the comparison subjects (r = .73) No gender effects were found, although age and educational level were associated with performance on both tests.