A Linear Voltage Stability Index to Estimate the Distance to Voltage Collapse

Abstract

This paper proposes a new voltage stability index (VSI) that has a more or less linear characteristic, and thus can provide better estimation of the distance to voltage collapse. It requires only the normal power flow solution and the type-1 low voltage solution of the critical or weakest bus of the system. The effectiveness of the proposed VSI in estimating the distance to voltage collapse is tested on a 5-bus system and the IEEE 14- and 30-bus systems. The results obtained through the proposed VSI are then compared with those found by other methods, as well as with the corresponding actual values found by repetitive power flow simulations.

Key Words:

• Voltage stability
• voltage collapse
• P–V curve
• low voltage solution

Additional information

Notes on contributors

M.H. Haque

MH Haque was born in Dinajpur, Bangladesh. He received his BSc, MSc and PhD degrees in Electrical Engineering in 1980, 1983 and 1988, respectively. He served the Department of Electrical and Electronic Engineering, Bangladesh University of Engineering and Technology, Dhaka, Bangladesh, as a Lecturer for four years. He joined the Department of Electrical Engineering, King Fahd University of Petroleum and Minerals (KFUPM), Dhahran, Saudi Arabia, as a Lecturer in 1984. He was promoted to an Assistant Professor in 1989 and an Associate Professor in 1993 at KFUPM. He served the School of Electrical Engineering, University of South Australia, Australia, as a Senior Lecturer for three years and The Flinders University of South Australia for one year. Since 1998, he has been with the Nanyang Technological University, Singapore, as an Associate Professor in the School of Electrical and Electronic Engineering. His main fields of interest are power system steady-state and dynamic analyses, voltage stability, and FACTS devices. He is a Fellow of Engineers Australia and a Senior Member of IEEE, USA.